Particulars Scanning TCT System is a complete setup for measurements of transient currents generated in semiconductor sensors with narrow laser beam
It can be used for standard and Edge-TCT measurements. Edge-TCT enables measurements of charge collection and carrier velocity profiles – crucial for understanding the performance of heavily irradiated detectors.
Features
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Fibre coupled laser with optics on translation stage
• Laser diode 660 nm or 1064 nm
• Tunable pulse width 0.4 ns – 4 ns
• Tunable pulse power equivalent to 10 MIP – 100 MIP in Si
• Single pulse mode 50 Hz to 1 MHz
• 1024 bits deep pulse sequence
• NIM logic trigger output
• NIM external trigger
• USB control
Sample mounting
• Aluminium support block on XY translation stage:
< 1 μm precision, 2 kg load, 5 cm range
• Block fixed to water cooled Peltier element
(40 W, ΔT ~ 40 °C)
• PT100 for temperature measurement
Software
Executables with GUI for complete measurement
control: Laser control, stage movement, data
acquisition
ROOT based package for analysis of TCT signals