SCANNING TCT SYSTEM
Particulars Scanning TCT System is a complete setup for measurements of transient currents generated in semiconductor sensors with narrow laser beam
FEATURES
Wide band current amplifier
Bias-T
High voltage low pass filter
Laser diode (650 nm, 1064 nm)
Programmable laser driver for sub-nanosecond laser pulses
Laser beam optics, beam spot 8 μm FWHM
XYZ moving stages for precise DUT positioning in the beam and focus tuning
Water cooled Peltier mounting block for DUT temperature control
Aluminium closure for light and RF shielding and atmosphere control
Dimensions: 80x40x40 cm
XYZ moving stages for precise DUT positioning in the beam and focus tuning
Hardware control software (connection via USB)
Data acquisition software
ROOT based package for data analysis
Fibre coupled laser with optics on translation stage
• Laser diode 660 nm or 1064 nm
• Tunable pulse width 0.4 ns – 4 ns
• Tunable pulse power equivalent to 10 MIP – 100 MIP in Si
• Single pulse mode 50 Hz to 1 MHz
• 1024 bits deep pulse sequence
• NIM logic trigger output
• NIM external trigger
• USB control
Sample mounting
Aluminium support block on XY translation stage:
< 1 μm precision, 2 kg load, 5 cm range
Block fixed to water cooled Peltier element
(40 W, ΔT ~ 40 °C)
PT100 for temperature measurement
