Research Instruments
Alibava Systems develops advanced instrumentation for semiconductor detector characterization, laser testing and beam diagnostics. Our research platforms are designed for universities, laboratories and scientific facilities requiring reliable, high-precision measurement solutions.
Our Research Instrument Portfolio
Explore our complete range of characterization systems developed for detector research and semiconductor testing.
BEAM INTENSITY & POSITION MONITORS
Alibava Beam Intensity & Position Monitors provide continuous X-ray beam diagnostics with high transmission and excellent measurement stability. Designed for synchrotron beamlines, laboratory systems and custom scientific instrumentation, they allow real-time monitoring of beam intensity and position with minimal impact on the X-ray beam.
ALIBAVA SYSTEM CLASSIC
Alibava System Classic is a compact and portable readout platform designed for the electrical characterization of silicon microstrip detectors. The system combines dedicated acquisition electronics, detector interfaces and software into a complete solution for detector research, development and laboratory testing.
AliVata System
Your content goes here. Edit or remove this text inline or in the module Content settings. You can also style every aspect of this content in the module Design settings and even apply custom CSS to this text in the module Advanced settings.
LASER SYSTEM
A plug and play equipment featuring a Class 1 laser diode with a driver to use it in pulse mode via an external trigger signal. Fully compatible with the Alibava System Classic (ASC)
SCANNING TCT SYSTEM
Particulars Scanning TCT System is a complete setup for measurements of transient currents generated in semiconductor sensors with narrow laser beam
LARGE SCANNING TCT
Large Scanning-TCT aims for the same applications as Scanning TCT. The main difference with respect to the latter is the vertical placement of the optical system and larger and more robust stages that can carry heavy load.